夏高令,杨银辉,李赵中

• 1:昆明理工大学材料科学与工程学院

摘要(Abstract)：

采用动电位极化和双环电化学动电位再活化法(DL-EPR)等研究了不同焊接热输入对超低Ni双相不锈钢热影响区(HAZ)耐蚀性的影响，采用光学显微镜(OM)和透射电镜(TEM)对热影响区的组织结构进行表征。结果表明，热输入后使热影响区的耐腐蚀元素Cr、Mo来不及向铁素体(δ)充分扩散，导致δ相点蚀当量值(PREN)低于奥氏体(γ)相。在热输入为8.48～25.42 kJ/cm的范围内，热影响区中因魏氏奥氏体(WA)出现以及δ相中Cr_2N析出，降低了其耐点蚀性能，点蚀主要集中在δ相上。热输入为29.35 kJ/cm时冷却速率降低，导致热影响区中WA以及δ相中Cr_2N减少，获得了最大点蚀电位E_b,为0.26 V。热影响区中晶内奥氏体(IGA)和晶界奥氏体(GBA)含量的增加和粗化，降低了γ/δ两相界面数量并覆盖了部分δ/δ晶界，使热影响区获得最小晶间敏感值R_a,为58.3%,具有较好的耐晶间腐蚀性能。

关键词(KeyWords)： 超低Ni双相不锈钢;热输入;点腐蚀;晶间腐蚀

Abstract:

Keywords:

基金项目(Foundation): 国家自然科学基金(51861019)

作者(Author): 夏高令,杨银辉,李赵中

DOI: 10.13289/j.issn.1009-6264.2022-0656

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