Sn-3Ag/Cu接头在钎焊和时效中IMC的生长和晶体取向分析
程从前,赵杰,杨朋,朱凤
摘要(Abstract):
研究了Sn-3Ag/Cu钎焊接头在液相钎焊和固相时效后界面金属间化合物(IMC)的生长行为和晶体取向。实验结果表明,液相反应和固相反应生成的IMC形貌差别很大;液相钎焊时IMC生长与时间的0.4次方成正比,而在固相时效时IMC生长与时间的平方根成正比,其生长激活能为90kJ/mol;通过液固晶体取向对比,发现液态钎焊和固相时效中晶体取向没有明显变化。
关键词(KeyWords): 金属间化合物;生长;形貌;晶体取向
基金项目(Foundation): 国家自然科学基金(50271013);; 辽宁省科研基金(042020)
作者(Author): 程从前,赵杰,杨朋,朱凤
参考文献(References):
- [1]Abtew M,Selvaduray G.Lead-free solders in microelectronics[J].Materials Science and Engineering R,2000,27:95.
- [2]Kim K S,Huh S H,Suganuma K.Effects of fourth alloying additive on microstructures and tensile properties of Sn-Ag-Cu alloy and joints with Cu[J].Microelectronics Reliability,2003,43:259-267.
- [3]ZHAO Jie,QI Lin,WANG Lai,et al.Microstructures evolution and its influence on mechanical properties in Sn-Ag-Cu-Bi lead-free solders after agingtreatment[J].Acta Scientiarum Naturalium Universitatis Sunyatseni,2003,SJ(42):28-31.
- [4]Zhao J,et al.Influence of Bi on microstructures evolution and mechanical properties in Sn-Ag-Cu solder[J].J Alloys and Compounds,2004,375:196-201.
- [5]Ikuo Shohji,Tomohiro Yoshida,Takehiko Takahashi,et al,Tensile properties of Sn-Ag based lead-free solders and strain rate sensitivity[J].Materials Scienceand Engineering A,2004,366:50-55.
- [6]Lee Hwa-Teng,Chen Ming-Hung,et al.Influence of interfacial intermetallic compound on fracture behavior of solder joints[J].Materials and Engineering A,2003,358:134-141.
- [7]Guo F,Choi S,Subramanian K N,et al.Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions[J].MaterialsScience and Engineering A,2003,351:190-199.
- [8]Bartels F,Morris J W,et al.Intermetallic phase formation in thin solid-liquid diffusion couples[J].J Electron Mater,1994,23(8):787-790.
- [9]Prakash K H,Sritharan T.Interface reaction between copper and molten tin-lead solders[J].Acta Mater,2001,49:2481-2489.
- [10]He Min,Chen Zhong,Qi Guojun.Solid state interfcial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization[J].Acta Mater,2004,52:2047-2056.
- [11]于大全.电子封装互连无铅钎料及其界面问题研究[D].大连理工大学,2004.
- [12]Choi S,Bieler T R,Lucas J P,et al.Characterization of the growth of intermetallic interfacial layers of Sn-Ag and Sn-Pb eutectic solders and their compositesolders on Cu substrate during isothermal long-term aging[J].J Electron Mater,1999,28(11):1209-1215.
- [13]Vianco P T,Ericjson J L,Hopkin P L.Solder state intermetallic compound growth bewteen copper and high temperature,tin-rich solders—partⅠ:experimental analysis[J].J Electron Mater,1994,23(8):721-727.
- [14]段莉蕾.无铅钎料接头界面化合物层生长及元素扩散行为[D].大连理工大学,2004.
- [15]Chio W K,Lee H W.Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy andCu substrate[J].J Electron Mater,2000,20(10):1207-1213.
- [16]Flanders D R,Jacobs E G,Pinzzotto R F.Activation energies of intermetallic growth of Sn-Ag eutectic solder on copper substrate[J].J Electron Mater,1994,23(7):583-594.
- [17]Ma D,Wang W D,Lahiri S K.Scallop formation and dissolution of Cu-Sn intermetallic compound during solder reflow[J].J Appl Phy,2002,91(5):3312-3317.
文章评论(Comment):
|
||||||||||||||||||
|
||||||||||||||||||