热处理对氧化铝陶瓷表面铜膜性能的影响Effects of heat treatment on performance of Cu films fabricated by magnetron sputtering on Al2O3 substrate
乔英杰,付洪波,崔新芳
摘要(Abstract):
采用射频磁控溅射方法在Al2O3陶瓷基底上淀积厚度为500 nm的Cu膜,并将其于真空热处理炉中采用30℃/min和5℃/min两个升温速率升温至400℃退火处理2 h,研究了退火升温速度对铜膜表面形貌、电阻率及附着力的影响。结果表明:退火热处理使Cu薄膜表面粗糙度增加,铜膜电阻率降低,膜-基结合力增强。且30℃/min快速升温较5℃/min缓慢升温退火热处理,Cu薄膜表面粗糙度低,Cu薄膜表面电阻率低,膜-基结合力差。利用自由电子气理论和扩散理论对退火热处理过程引起的性能变化进行了分析解释。
关键词(KeyWords): 磁控溅射;Cu膜;退火热处理;微结构;性能
基金项目(Foundation): 国家自然科学基金项目(60971020)
作者(Author): 乔英杰,付洪波,崔新芳
DOI: 10.13289/j.issn.1009-6264.2013.02.007
参考文献(References):
- [1]Qiu H,Wang F P,Wu P,et al.Structural and electrical properties of Culms deposited on glass by DC magnetron sputtering[J].Vacuum,2002,66(3-4):447-452.
- [2]Jha H,Kikuchi T,Sakairi M,et al.Area-selective microscale metallization on porous anodic oxide film of aluminium[J].ElectrochemistryCommunication,2007,9(7):1596-1601.
- [3]Kang S H,Obeng Y S,Decker M A,et al.Effect of annealing on the surface microstructural evolution and the electromigration reliability ofelectroplated Cu films[J].Journal of Electronic Materials,2001,30(2):1506-1512.
- [4]Tsang C F,Woo J.Effect of nitrogen and oxygen annealing on the morphology and hardness behavior of copper thin films[J].MaterialsCharacterization,2000,45(3):187-194
- [5]Qian L H,Lu Q H,Kong W J,et al.Electrical resistivity of fully-relaxed grain boundaries in nanocrystalline Cu[J].Scripta Matialia,2004,50(11):1407-1411.
- [6]Okolo B,Lamparter P,Welzel U,et al.The effect of deposition parameters and substrate surface condition on texture,morphology and stress inmagnetron-sputter-deposited Cu thin films[J].Thin Solid Films,2005,474(1-2):50-63
- [7]雒向东,罗崇泰.退火态Cu膜表面形貌的分形特征[J].电子显微学报,2009,28(3):209-212.LUO Xiang-dong,LUO Chong-tai.Fractal properties of surface morphology of Cu films annealed at different temperature[J].Journal of ChineseElectron Microscopy Society,2009,28(3):209-212.
- [8]George P.Inuence of anomalous roughness growth on the electrical conductivity of thinlms[J].Physicl Revew B,2005,71(20):1105-1107.
- [9]王新建.溅射铜和铜合金薄膜的微观结构与性能[D].上海:上海交通大学,2009.
- [10]张树人,张国良,郭太良.高性能导电薄膜的制备[J].真空,2007,44(3):24-27.ZHANG Shu-ren,ZHANG Guo-liang,GUO Tai-liang.Preparation of high-performance conductive thib film[J].Vacuum,2007,44(3):24-27
- [11]雒向东,吴学勇,赵海阔.磁控溅射300nm铜膜的电学性能研究[J].微电子学,2007,37(6):836-828.LUO Xiang-dong,WU Xue-yong,ZHAO Hai-kuo.Study on electrical properties of 300 nm-thick Cu-films deposited by magnetron sputtering[J].Microelectronics,2007,37(6):836-828.
- [12]王晓平,赵特秀,季航,等.晶粒尺寸对薄膜电阻率温度系数的影响[J].物理学报,1994,43(2):297-301.WANG Xiao-ping,Zhao Te-xiu,JI Hang,et al.Effect of grain size on temperature coefficient of resistivity of Pb thin films[J].Acta Physica Sinica,1994,43(2):297-301
- [13]郑伟涛.薄膜材料与薄膜技术[M].北京:化学工业出版社,2007:79.
- [14]Zhang J,Tanaka H,Kanki T,Strain effect and the phase diagram of La{1-x}MnO{3}thin films[J]Physical Review,2001,64(18):184404-1884407.
- [15]Koo T Y,Park S H,Lee K B,et al.Anisotropic strains and megnetoresistance of LaCaMnO[J].Applied Physics Letters,1997,71:977-980.
- [16]程丙勋,吴卫东,何智兵,等.退火温度对溅射铝膜结构与电性能的影响[J].强激光与粒子束,2008,20(1):155-158.CHENG Bing-xun,WU Wei-dong,HE Zhi-bing,et al.Effects of annealing temperature on microstructure and electric properties of Al films[J].HighPower Laser and Paraticle Beams,2008,20(1):155-158.
- [17]Vinci R P,Zielinski E M,Bravman J C.Thermal strain and stress in copper thin films[J].Thin Solid Films,1995,262:142-153.
- [18]Shariati M,Ghoranneviss M,Hosseini H,et al.Effect of annealing temperature on properties of Al-Cu-N thin films deposited by DC magnetronsputtering[J].Surface and Coatings Technology,2007,201(9-11):5570-5573.
文章评论(Comment):
|
||||||||||||||||||
|
||||||||||||||||||