王知鸷,祖方遒,张先峰,王丽芳

• 1:合肥工业大学材料科学与工程学院
• 2:常州大学机械工程学院

摘要(Abstract)：

在不同喷铸温度下制备了Zr55Al10Ni5Cu30块体非晶试样,利用电阻率法研究熔体温度对非晶结构弛豫的影响。结果表明,缺陷散射对电阻率的影响高于电子声子散射的影响;低温结构弛豫时,在1300℃时制备的试样保温前后电阻率的差值出现负值;高温结构弛豫后,随着制备非晶时熔体温度的升高,保温前后电阻率的差值逐渐减小。

关键词(KeyWords)： 大块非晶;结构弛豫;电阻率;熔体温度

Abstract:

Keywords:

基金项目(Foundation): 国家自然科学基金资助项目(50971053)

作者(Author): 王知鸷,祖方遒,张先峰,王丽芳

DOI: 10.13289/j.issn.1009-6264.2013.05.006

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