热浸镀锡电子铜带材回流焊过程中镀锡层的微观结构及缺陷分析Microstructure and defect analysis of tin coating of hot-dip tin-plated electronic copper strip during reflow soldering
欧阳豫鲁,张国赏,柳亚辉,朱倩倩,宋克兴,皇涛,张彦敏,刘栋
摘要(Abstract):
热浸镀锡电子铜带材是高端连接器和PCB(Printed circuit board)所需的关键导体材料,该材料在回流焊过程中产生的缺陷严重影响其服役性能。采用扫描电镜(SEM)、能谱仪(EDS)对热浸镀锡铜带材回流焊过程中缺陷组织类型及分布形态进行表征,并对回流焊锡珠样品、回流焊非正常样品和回流焊正常样品的表层形貌进行对比。结果表明:回流焊过程中,样品镀层中均产生了不同程度的孔洞缺陷,孔洞尺寸在0.2~36μm,孔洞的产生与基体合金类型、基体合金厚度和镀层厚度无明显关联;孔洞形态并不一致,发现了孔洞边缘呈现出立体网状结构、边缘参差不齐、孔洞中存在小颗粒的现象。回流焊过程中,镀锡层中Cu、Sn元素发生了重新分布,不同缺陷所造成的元素分布情况并不相同。镀层结构中,化合物层、多相界面间高低起伏与镀层表面高度起伏无明显关联。
关键词(KeyWords): 热浸镀锡;回流焊;铜带材;镀层缺陷;锡珠
基金项目(Foundation): 河南省科技研发计划联合基金(231111231700);; 河南省重点研发与推广专项(科技攻关)(21011914)
作者(Author): 欧阳豫鲁,张国赏,柳亚辉,朱倩倩,宋克兴,皇涛,张彦敏,刘栋
DOI: 10.13289/j.issn.1009-6264.2023-0475
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