基体负偏压对W-C-N薄膜摩擦磨损性能的影响Effects of negative bias voltage on tribological properties of W-C-N thin films by magnetron sputtering
喻利花,王蕊,许俊华
摘要(Abstract):
采用多靶反应磁控溅射设备制备了一系列不同基体负偏压的W-C-N复合膜。采用X射线衍射仪、扫描电镜、能量色散谱仪、纳米压痕仪和摩擦磨损仪对薄膜进行表征。结果表明:当负偏压小于等于80 V时,薄膜表现出六方α-WCN相结构,增加到120 V时,转变为立方β-WCN相,薄膜硬度、弹性模量和膜基结合力出现对应最佳性能点的峰值;随着负偏压的增大,薄膜质量得到改善,磨损率和摩擦系数明显降低,负偏压达到200 V时,磨损率和摩擦系数分别出现最低值4.22×10-6mm3.N-1.m-1和0.27;薄膜的磨损机制主要是磨粒磨损。
关键词(KeyWords): W-C-N复合膜;磁控溅射;基体负偏压;摩擦磨损性能
基金项目(Foundation): 国家自然科学基金资助项目(51074080);; 江苏省自然科学基金资助项目(BK2008240)
作者(Author): 喻利花,王蕊,许俊华
DOI: 10.13289/j.issn.1009-6264.2013.04.001
参考文献(References):
- [1]Kim K R,Suh C M,Murakami R I,et al.Effect of intrinsic properties of ceramic coatings on fatigue behavior of Cr-Mo-V steels[J].Surface andCoatings Technology,2003,171(1-3):15-23.
- [2]Cunha L,Andritschky M,Robouta L,et al.Corrosion of TiN,(TiAl)N and CrN hard coatings produced by magnetron sputtering[J].Thin SolidFilms,1998,317(1-2):351-355.
- [3]Lee H Y,Han J G,Baeg S H,et al.Structure and properties of WC-CrAlN superlattice films by cathodic arc ion plating process[J].Thin Solid Films,2002,420-421(1):414-420.
- [4]Cavaleiro A,Trindade B,Vieira M T.Influence of Ti addition on the properties of W-Ti-C/N sputtered films[J].Surface and Coatings Technology,2003,174-175(1):68-75.
- [5]Louro C,Cavaleiro A.Hardness versus structure in W-Si-N sputtered coatings[J].Surface and Coatings Technology,1999,116-119(1):74-80.
- [6]汪蕾,董师润,尤建飞,等.Ti(C,N)复合膜和TiN/Ti(C,N)多层膜组织和显微硬度[J].材料热处理学报,2010,31(2):113-118.WANG Lei,DONG Shi-run,YOU Jian-fei,et al.Microstructure and microhardness of Ti(C,N)and TiN/Ti(C,N)multilayer films[J].Transaction ofMaterials and Heat Treatment,2010,31(2):113-118.
- [7]喻利花,薛安俊,董松涛,等.Si含量对Ti-Al-Si-N薄膜微结构与力学性能的影响[J].材料热处理学报,2010,31(7):140-145.YU Li-hua,XUE An-jun,DONG Song-tao,et al.Influence of Si content on microstructure and mechanical property of Ti-Al-Si-N films[J].Transactionof Materials and Heat Treatment,2010,31(7):140-145.
- [8]梅永辉,董松涛,熊宁,等.Al元素对Zr-Si-N复合膜的微结构与力学性能的影响[J].金属热处理,2009,34(11):1-4.MEI Yong-hui,DONG Song-tao,XIONG Ning,et al.Effect of Al element on microstructure and mechanical properties of Zr-Si-N composite films[J].Heat Treatment of Metals,2009,34(11):1-4.
- [9]靳树强,董松涛,尤建飞,等.Zr-Al-N及Zr-Al-Si-N复合膜的微结构及力学性能[J].金属热处理,2009,34(10):12-15.JIN Shu-qiang,DONG Song-tao,YOU Jian-fei,et al.Microstructure and mechanical properties of Zr-Al-N and Zr-Al-Si-N composite films[J].HeatTreatment of Metals,2009,34(10):12-15.
- [10]Gesheva K A,Blakhov E S,Stoyanov G I,et al.Deposition and characterization of CVD-tungsten and tungsten carbonitrides on(100)Si[J].CeramicsInternational,1996,22(1):87-89.
- [11]Kim S D.Microstructural properties of plasma-enhanced chemical vapor deposited WNx films using WF6-H2-N2 precursor system[J].Current AppliedPhysics,2007,7(4):426-433.
- [12]Elers K E,Saanila S,Li W M,et al.Atomic layer deposition of WxN/TiN and WNxCy/TiN nanolaminates[J].Thin Solid Films,2003,434(1-2):94-99.
- [13]Su Y D,Hu C Q,Wen M,et al.Effects of bias voltage and annealing on the structure and mechanical properties of WC0.75N0.25 thin films[J].Journalof Alloys and Compounds,2009,486(1-2):357.
- [14]Ospina R,Jurado J F,Vélez J M,et al.Structural and morphological characterization WCxNy thin films grown by pulsed vacuum arc discharge in anargon-nitrogen atmosphere[J].Surface and Coatings Technology,2010,205(7):2191-2196.
- [15]Oh U C,Je J H.Effects of strain energy on the preferred orientation of TiN thin films[J].Journal of Applied Physics,1993,74(3):1692-1696.
- [16]Sellers J.Asymmetric bipolar pulsed DC:the enabling technology for reactive PVD[J].Surface and Coatings Technology,1998,98(1-3):1245-1250.
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